Abstract: The exchange stiffness constant Aex was linearly propositional to the difference of spin waveresonance field HSWR and ferromagnetic resonance field HFMR. In this work, we measured theHSWR and HFMR with in-plane angles in order to analyze the angular dependence of Aex in NiFethin film with thickness of 100 nm. The Aex of NiFe thin film was shown isotropic behavior notdepending on the in-plane angles. The measured value of Aex was 10.9×10−7erg/cm and its valueshould be applied to the spin wave devices.
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