Abstract: This Paper Proposes A Variety Of On-Chip Monitors In Order To Implement A Low-Cost Test Methodology For Circuits And Radio-Frequency (Rf) Systems After The High Volume Production Stage. It Is Not The First Time That We Publish Such Monitors But The Aim Of Our Work Is To Extend The Library Of Rf Circuits Circuit Under Test (Rf Cut Lib) On Which Our Sensors Are Evaluated. Notice That For Each Rf Circuits The Proposed Monitors Must Be Adapted To Be Able To Present A High Test Coverage. The Monitors Are Called "Dummy Circuits" And "Process Monitors". These Monitors Have No Electrical Contact With The Circuit Under Test And Do Not Touch The Signal Path. In Fact, They Are Placed At The Layout Level Near The Circuit Under Test. Consequently............
Key Words: Built-in Test, RF Test, machine learning, RF design
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